Earliest Paper with Porous
Silicon Based Micromachining Process
Tu Xiang Zheng
The present author published a paper with the title “Fabrication of Silicon Microstructures Based on Selective Formation and Etching of Porous Silicon” in J. Electrochem. Soc, Vol. 135, No. 8, in August 1988. It was the earliest paper that describes silicon microstructures formed based on porous silicon micromachining process.
The next paper with the title “Using porous silicon as a
sacrificial layer” by P Steiner, A Richter and W Lang. was published
in 1993, in Journal of
Micromechanics and Microengineering Volume 3, Number
1.
The silicon microstructures were tiny mechanical devices
such as sensors, valves, gears, mirrors, and actuators embedded in silicon chips.
Before porous silicon micromachining or 1988 year, all these devices were
produced by bulk micromachining process or surface micromachining processing.
Silicon wafers can
be anisotropically wet etched, forming highly
regular structures. Wet etching typically uses alkaline liquid solvents, such as potassium hydroxide (KOH)
or tetramethylammonium
hydroxide (TMAH) to dissolve silicon. These alkali solvents
dissolve the silicon in a highly anisotropic way so as to produce V-shaped
grooves.
Surface micromachining process
builds microstructures by deposition and etching of different structural layers
on top of the silicon wafer. Generally polysilicon is commonly
used as one of the layers and silicon dioxide is used as
a sacrificial layer which is removed or etched out to create the
necessary void in the thickness direction. Added layers are generally very thin
with their size varying from a few microns.
The earliest paper provided a new micromachining process for
silicon microstructures formation. The process consists of selective
anodization of silicon in concentrated HF solution to form porous silicon and etching
of the porous silicon in dilute KOH solution to form desired microstructures. In
the process a starting material was n-type silicon wafer having resistivity in
the range of 3.2 - 4.8 Ω-cm. Proton implantation with post-implantation
annealing was employed to produce a high donor concentration layer in the wafer.
Then nitrogen implantation was performed to create highly resistive region in
the high donor concentration layer. The un-implanted regions provided the entrance
windows through which the anodic current was able to reach the underneath layer.
Since the donor concentration in the wafer was much lower than that in the
proton implanted layer, the anodic reaction could be stopped automatically at
the interface between the high donor concentration layer and the un-implanted
regions.
The porous silicon micromachining incorporates the
advantages of both bulk and surface micromachining:
- The porous silicon layer as a sacrificial layer can be formed in the silicon wafer and processed from the front side.
- Porous silicon is rapidly etched in dilute hydroxide solutions at room temperature.
- Sacrificial layer formation can be patterned both by selective substrate doping, as porous silicon formation is highly selective with respect to different dopant types and concentrations, and by masking of the substrate.
- Deep channels can be formed in the silicon wafer removing a formed porous layer.
- Porous silicon provides a planar sacrificial surface and is formed much more quickly than thermally grown or chemically deposited sacrificial layers.
- It can also be oxidized to form thick sacrificial oxide layers, thick oxide layers for thermal isolation or for SOI applications.
- Using porous silicon as a sacrificial layer also greatly reduces processing time and complexity, as well as device area, over bulk micromachining.
- It is possible to manufacture free-standing structures of high mechanical and electrical quality since the mechanical structures may be constructed from single crystal silicon.
Using porous silicon micromachining process the present
author had developed several MEMS sensors and actuators. Among them are
piezoresistive pressure sensors, thermal flow sensors, thermal conducting
(vacuum) sensors, capacitive pressure sensors, and ink jet printer heads.